At the Pinnacle of Precision and Reliability

Welcome to SWS-Tec – Your Trusted Partner in Semiconductor, Wafer and Sensor Technology

SEMICONDUCTOR

THIN FILM

SOLAR INDUSTRY

BULK APPLICATIONS

INVENTIVENESS

At the Forefront of Innovation

PVR – Solar Wafer Inspection System

Active measuring range:

+/-0.375 mm from gap center

Resistance range:

8 Ω/sq to 600 Ω/sq

Std. Dev. (1𝜎):

< 1 % @ 100 Ω/sq
< 5 % @ 500 Ω/sq

PN-type Sensor:

Available

MRes – 2000 Contactless Resistivity Measurement System [300 mm]

Wafer size:

100 mm to 300 mm

Wafer thickness:

150 µm up to 1,200 µm

Resistance range:

0.005 Ω/sq to 100 kΩ/sq

Std. Dev. (1𝜎):

<< 1 % for < 5,000 Ω/sq
<< 0.1 % for < 500 Ω/sq

PN-type Sensor:

Available

MRes – 2000M Manual Contactless Resistivity Measurement System

Wafer size:

100 mm to 300 mm

Wafer thickness:

150 µm up to 1,200 µm

Resistance range:

 0.005 Ω/sq to 100 kΩ/sq

Std. Dev. (1𝜎):

<< 1 % for < 5,000 Ω/sq
<< 0.1 % for < 500 Ω/sq

PN-type Sensor:

Available

Semiconductor Wafer and Sensor Technology: With over two decades of experience, SWS-Tec has been at the forefront of innovation in the semiconductor, wafer, and sensor technology sectors.

Collaborating closely with both industry pioneers and esteemed research institutions, we have established ourselves as a leading developer and manufacturer of precision measurement devices tailored for the semiconductor and solar industries, as well as research departments worldwide.

Semiconductor Wafer and Sensor Technology

At SWS-Tec, we specialize in the design and construction of cutting-edge measurement devices catered specifically to the demands of modern semiconductor and solar technologies. Our expertise spans a wide range of capabilities, from measuring bulk resistivity in standard silicon wafers with diameters up to 300 mm to accurately determining sheet resistance in thin conductive layers. Whether it’s a GaN layer atop a non-conductive substrate or a delicate metallic layer deposited on various substrates such as foil or glass, our state-of-the-art measurement principle based on eddy current resistivity ensures unparalleled accuracy and reliability.

Semiconductor Wafer and Sensor Technology

Moreover, our advanced devices are equipped to measure not only the thickness of wafers but also the thickness of conductive layers within the same instrument.

In the solar industry, we offer specialized solutions for measuring wafer resistance and dopant concentration, facilitating the crucial differentiation between n-doped and p-doped wafers.

Since our inception, SWS-Tec has proudly served numerous industry partners for more than two decades, and our commitment to excellence ensures that our devices continue to deliver reliable performance year after year.

Partner with SWS-Tec today and experience the pinnacle of precision and reliability in semiconductor, wafer, and thin film technology measurement solutions.

We are here to help!

GDPR*

6 + 8 =

Information you provide in the form is used and stored to process your enquiry and, if you have allowed the cookies, to improve content personalisation.

SWS-Tec processes personal information responsibly. For more information, please review our Privacy Policy (General Data Protection Regulation/GDPR).

* Mandatory field

 

Office

D-85598 Baldham, Germany

Hours

M-F: 9am – 5pm
S-S: Closed

Call Us

+49-8106 3 94 81 46
+49-8094 7 08 45 52