PVR Solar Wafer Inspection System

Designed for excellence in the solar wafer industry.

ACCURACY

State of the Art

Non contact resistance measurement

Measuring Data

Active measuring range:

+/-0.375 mm from gap center

Resistance range:

8 Ω/sq to 600 Ω/sq

Std. Dev. (1𝜎):

<< 1 % @ 100 Ω/sq
<< 5 % @ 500 Ω/sq

Data point acquisition interval:

4 milliseconds

 

PVR Solar Wafer Inspection System

PVR Solar Wafer Inspection System: Discover the PVR, our cutting edge non contact resistance measurement system designed for excellence in the solar wafer industry. With over two decades of expertise in eddy-current based resistivity measurements, the PVR sets the industry standard, offering unmatched precision and reliability.

Tailored to handle standard solar wafer sizes, including the latest half-cut-wafers, and featuring a comfortable active measuring range within the sensor gap of 0.75 mm, the PVR stands out for its versatility. It is an ideal solution for swift and accurate receiving and output wafer inspection, addressing the unique needs of the solar industry. The PVR showcases a standard resistance range of 8 Ω/sq up to 600 Ω/sq, ensuring meticulous inspection for both monocrystalline and polycrystalline solar wafers.

P-type/N-type

What distinguishes the PVR is its capability not only to measure resistance without slowing down the wafer transportation speed within the production line but also to discern the wafer dopant, identifying whether it is P-type or N-type doped.

With a standard deviation (1𝜎) of less than one percent, we assure consistency in every measurement.

Recognizing the critical role of PVR systems in your production line, every PVR system from SWS-Tec comes with a calibration wafer. This ensures accurate functionality documentation and easy tuning if required.

Installing the PVR into your conveyor system is a breeze, thanks to the separation of the top and lower parts for installation.

An industry-standard Ethernet connection guarantees stable and seamless integration into your network.

Explore our range of products if you require a different set of features. For any inquiries or specific requirements, do not hesitate to reach out. At SWS-Tec, we are dedicated to advancing your measurement needs with state-of-the-art technology.

SWS-Tec Semiconductor Wafer Sensor Technology

Performance properties

  • Ultrafast, on-the-flight, data acquisition
  • Data point acquisition interval of 4 ms
  • Up to 3 sensors
  • Mono- and poly-crystalline wafer
  • P/N type sensor
  • Simple data processing
  • Ethernet interface
  • Comfortable integration to state of the art production lines
  • Remarkable sensor gap

We are here to help!

GDPR*

10 + 3 =

Information you provide in the form is used and stored to process your enquiry and, if you have allowed the cookies, to improve content personalisation.

SWS-Tec processes personal information responsibly. For more information, please review our Privacy Policy (General Data Protection Regulation/GDPR).

* Mandatory field

 

Office

D-85598 Baldham, Germany

Hours

M-F: 9am – 5pm
S-S: Closed

Call Us

+49-8106 3 94 81 46
+49-8094 7 08 45 52