Hands on Bulk Applications

With precise and reliable bulk measurements

MRes – 2000 Contactless Resistivity Measurement System [200 mm]

Wafer size:	50 mm to 200 mm
Wafer thickness:	150 µm up to 1,200 µm
Resistance range:	0.005 Ω/sq to 100 kΩ/sq
Std. Dev. (1𝜎):	<< 1 % for < 5,000 Ω/sq << 0.1 % for < 500 Ω/sq
PN-type Sensor:	Available
Automatic mapping:	True

SOFTWARE

MRes – 2000 Contactless Resistivity Measurement System [300 mm]

Wafer size:	100 mm to 300 mm
Wafer thickness:	150 µm up to 1,200 µm
Resistance range:	0.005 Ω/sq to 100 kΩ/sq
Std. Dev. (1𝜎):	<< 1 % for < 5,000 Ω/sq << 0.1 % for < 500 Ω/sq
PN-type Sensor:	Available
Automatic mapping:	True

SOFTWARE

MRes – 2000M Manual Contactless Resistivity Measurement System

Wafer size:	100 mm to 300 mm
Wafer thickness:	150 µm up to 1,200 µm
Resistance range:	0.005 Ω/sq to 100 kΩ/sq
Std. Dev. (1𝜎):	<< 1 % for < 5,000 Ω/sq << 0.1 % for < 500 Ω/sq
PN-type Sensor:	Available
Automatic mapping:	False

Discover Your Bulk Semiconductor Properties

In the semiconductor industry, accurate measurement of bulk properties is essential for a wide range of applications. At SWS-Tec, our advanced measurement devices are capable of hosting semiconductor wafers with thicknesses exceeding one millimeter, providing you with precise and reliable bulk measurements.

Precision Measurement for Bulk Semiconductors

Bulk Applications

Our technology is designed to meet the rigorous demands of both research and industrial applications. By focusing on the bulk properties of semiconductor wafers, our devices deliver unparalleled accuracy in non-contact thickness and resistivity measurement. This capability is crucial for various applications, including:

Power Electronics: Ensuring the quality and performance of thick semiconductor wafers used in high-power electronic devices.
LED Manufacturing: Precise bulk measurements for substrates used in LED production to enhance efficiency and reliability.
High-Frequency Devices: Optimizing the properties of wafers used in RF and microwave applications.

Drive Innovation with Our Bulk Measurement Solutions

With our non-contact measurement technology, you can achieve a deeper understanding of the bulk properties of your semiconductor wafers. This insight is essential for driving innovation and ensuring the highest standards of quality and performance in your products.

MRes 200 mm

MRes 300 mm

MRes Manual

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Office

D-85598 Baldham, Germany

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Hours

M-F: 9am – 5pm
S-S: Closed

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+49-8106 3 94 81 46
+49-8094 7 08 45 52