PVR Solar Wafer Inspection System

PVR Solar Wafer Inspection System

PVR Solar Wafer Inspection System: Discover the PVR, our cutting edge non contact resistance measurement system designed for excellence in the solar wafer industry. With over two decades of expertise in eddy-current based resistivity measurements, the PVR sets the industry standard, offering unmatched precision and reliability.

Tailored to handle standard solar wafer sizes, including the latest half-cut-wafers, and featuring a comfortable active measuring range within the sensor gap of 0.75 mm, the PVR stands out for its versatility. It is an ideal solution for swift and accurate receiving and output wafer inspection, addressing the unique needs of the solar industry. The PVR showcases a standard resistance range of 8 Ω/sq up to 600 Ω/sq, ensuring meticulous inspection for both monocrystalline and polycrystalline solar wafers.

P-type/N-type

What distinguishes the PVR is its capability not only to measure resistance without slowing down the wafer transportation speed within the production line but also to discern the wafer dopant, identifying whether it is P-type or N-type doped.

With a standard deviation (1𝜎) of less than one percent, we assure consistency in every measurement.

Recognizing the critical role of PVR systems in your production line, every PVR system from SWS-Tec comes with a calibration wafer. This ensures accurate functionality documentation and easy tuning if required.

Installing the PVR into your conveyor system is a breeze, thanks to the separation of the top and lower parts for installation.

An industry-standard Ethernet connection guarantees stable and seamless integration into your network.

Explore our range of products if you require a different set of features. For any inquiries or specific requirements, do not hesitate to reach out. At SWS-Tec, we are dedicated to advancing your measurement needs with state-of-the-art technology.

Performance properties

• Ultrafast, on-the-flight, data acquisition
• Data point acquisition interval of 4 ms
• Up to 3 sensors
• Mono- and poly-crystalline wafer
• P/N type sensor
• Simple data processing
• Ethernet interface
• Comfortable integration to state of the art production lines
• Remarkable sensor gap