Layer Thickness Measurement for Precision and Reliability

Our advanced layer thickness measurement technology utilizes an eddy-current-based, non-contact approach to provide highly accurate, non-destructive measurements. Designed for delicate and conductive layers, our layer thickness measurement system ensures precise readings without compromising material integrity. This innovative eddy-current-based layer thickness measurement solution is ideal for applications requiring fast, reliable results in quality control and manufacturing. Experience the advantages of non-contact layer thickness measurement for enhanced precision and efficiency across a variety of materials and layers.

Key Applications:

• Thin-Film Technologies: Ideal for assessing thin-film materials after deposition processes like PVD, CVD, MBE and ALD.
• Semiconductor Applications: Suitable for a wide range of semiconductor materials, like Si, GaN and SiC, supporting both research and production needs.
• Solar and Photovoltaic Applications: Designed to measure and optimize materials used in solar cells and other photovoltaic technologies.
• Innovative Glass Technologies: Applicable to architectural glass such as Low-E (low emissivity) glass and smart glass technologies.
• Lighting and Display Technologies: Supports OLED and LED material testing and development.