Advanced Eddy-Current Technology for Sheet Resistance Measurement

Sheet Resistance Thin Film – Our eddy-current-based sheet resistance measurement technology provides a highly accurate, non-contact sheet resistance solution. Unlike traditional methods, our non-contact sheet resistance approach ensures precise measurements without damaging materials. Designed for advanced applications, our eddy current-based sheet resistance measurement system can reliably measure sheet resistance across a range of conductive materials, delivering consistent, non-destructive results. Whether you’re looking to enhance quality control or boost production efficiency, our sheet resistance technology meets the highest standards for accuracy and reliability.

For a more detailed explanation about sheet resistance please check out our technology page.

Measurement geometry to define sheet resistance.

Precision Sheet Resistance Measurement on Thin Films

Sheet Resistance Thin Film – Our advanced sheet resistance measurement technology is specially optimized for thin films, offering accurate, non-contact measurements that preserve the integrity of delicate layers. Utilizing an eddy-current-based approach, our system provides fast, reliable sheet resistance measurement on thin films without the need for physical contact, making it a non-destructive solution ideal for sensitive materials.

Whether used for quality control in semiconductor manufacturing or material analysis in research, our thin-film sheet resistance measurement system ensures precise, repeatable results across a range of conductive and semi-conductive materials. Experience the efficiency and accuracy of our technology for high-performance thin-film applications, where precision and material preservation are essential.

Key Applications

• Thin-Film Technologies: Ideal for assessing thin-film materials after deposition processes like PVD, CVD, MBE and ALD.
• Semiconductor Applications: Suitable for a wide range of semiconductor materials, like Si, GaN and SiC, supporting both research and production needs.
• Solar and Photovoltaic Applications: Designed to measure and optimize materials used in solar cells and other photovoltaic technologies.
• Innovative Glass Technologies: Applicable to architectural glass such as Low-E (low emissivity) glass and smart glass technologies.
• Lighting and Display Technologies: Supports OLED and LED material testing and development.

Sheet Resistance (R_S)

Sheet resistance is given in ohms per square (Ω/sq) and can be calculated using:

where:

• ρ is the Resistivity of the material (Ω⋅m)
• t is the thickness of the material (m)

Resistivity (ρ)

Resistivity is given in ohm-meters (Ω·m) and can be calculated using:

where:

• ρ is the Resistivity of the material (Ω⋅m)
• R is the Resistance of the material (Ω)
• A is the cross-sectional area of the material (m^2)
• L is the length of the material (m)